Particle counter - Company Ranking(14 companies in total)
Last Updated: Aggregation Period:Sep 30, 2026〜Oct 27, 2026
This ranking is based on the number of page views on our site.
Display Company Information
| Company Name | Featured Products | ||
|---|---|---|---|
| Product Image, Product Name, Price Range | overview | Application/Performance example | |
| ● Complies with ISO 21501-4 (JIS B 9921) ● Particle size classification (5 levels) 0.3μm, 0.5μm, 1.0μm, 2.0μm, 5.0μm and above ● Compact... | Particle measurement in clean rooms Pharmaceutical manufacturing plant Electronic device manufacturing plant | ||
| Optical method: Side scattering method Light source: Semiconductor laser-excited solid-state laser Particle size range: 0.03 μm to 0.13 ... | Delivery of chemical supply plant for cutting-edge semiconductor manufacturing factory Chemical management for wet cleaning line Manufac... | ||
| ● Measurement particle size range: 0.1 μm, 0.15 μm, 0.2 μm, 0.3 μm, 0.5 μm and above ● Complies with JIS B 9921: 1997 ● Adopts a semiconduct... | Particle measurement in clean rooms Manufacturing process of precision parts Hard disk manufacturing process, etc. | ||
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- Featured Products
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Particle Counter for Airborne 0.3μm Multi-Point Monitoring KA-03
- overview
- ● Complies with ISO 21501-4 (JIS B 9921) ● Particle size classification (5 levels) 0.3μm, 0.5μm, 1.0μm, 2.0μm, 5.0μm and above ● Compact...
- Application/Performance example
- Particle measurement in clean rooms Pharmaceutical manufacturing plant Electronic device manufacturing plant
Particle Counter 30 Nano, HF Compatible KS-19F Rion
- overview
- Optical method: Side scattering method Light source: Semiconductor laser-excited solid-state laser Particle size range: 0.03 μm to 0.13 ...
- Application/Performance example
- Delivery of chemical supply plant for cutting-edge semiconductor manufacturing factory Chemical management for wet cleaning line Manufac...
Particle Counter Airborne 0.1μm KC-22A
- overview
- ● Measurement particle size range: 0.1 μm, 0.15 μm, 0.2 μm, 0.3 μm, 0.5 μm and above ● Complies with JIS B 9921: 1997 ● Adopts a semiconduct...
- Application/Performance example
- Particle measurement in clean rooms Manufacturing process of precision parts Hard disk manufacturing process, etc.
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